Patent · US Expired

Meter for an integrated diagnostic test system

USD506832S1 · kind S1 · design

18Cited by
81References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 2, 2004
Grant dateJun 28, 2005
Priority date
Expiry dateJun 28, 2019

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.