Meter for an integrated diagnostic test system
USD507657S1 · kind S1 · design
25Cited by
81References
1Claims
0Family size
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Key dates
| Filing date | Jun 2, 2004 |
| Grant date | Jul 19, 2005 |
| Priority date | — |
| Expiry date | Jul 19, 2019 |
Classification
- Technology area (CPC —)General
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.