Patent · US Expired

Measuring system

USRE31774E · kind E · reissue

12Cited by
1References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 15, 1983
Grant dateDec 18, 1984
Priority date
Expiry dateSep 15, 2003

Classification

  • Technology area (CPC —)General

Abstract

There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.