Scanning ion conductance microscope

USRE34708E · kind E · reissue

Assignee

• The Regents of the University of California · US

Inventors

• Paul K. Hansma · Isla Vista, US
• Barney Drake · Truckee, US

Key dates

• Filing date: Apr 29, 1992
• Grant date: Aug 30, 1994
• Expiry date: Apr 29, 2012

Classification

• Technology area (CPC —): General

Abstract

A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.