Automatic visual inspection system
USRE38559E1 · kind E1 · reissue
Inventors
Key dates
| Filing date | Jun 30, 2000 |
| Grant date | Jul 27, 2004 |
| Priority date | — |
| Expiry date | Jun 30, 2020 |
Classification
- Technology area (CPC —)General
Abstract
A binary map of an object having edges is produced by first producing a digital grey scale image of the object with a given resolution, and processing the grey scale image to produce a binary map of the object at a resolution greater than said given resolution. Processing of the grey scale image includes the step of converting the 2-dimensional digital grey scale image with a filter function related to the second derivative of a Gaussian function forming a 2-dimensional convolved image having signed values. The location of an edge in the object is achieved by finding zero crossings between adjacent oppositely signed values. Preferably, the zero crossings are achieved by an interpolation process that produces a binary bit map of the object at a resolution greater than the resolution of the grey scale image. The nature of the Gaussian function whose second derivative is used in the convolution with the grey scale image, namely its standard deviation, is empirically selected in accordance with system noise and the pattern of the traces on the printed circuit board such that the resulting bit map conforms as closely as desired to the lines on the printed circuit board.The convolution c…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.