Nonvolatile memory device and method of forming the same
USRE46389E1 · kind E1 · reissue
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2015 |
| Grant date | May 2, 2017 |
| Priority date | — |
| Expiry date | Apr 15, 2035 |
Classification
- Technology area (CPC —)General
Abstract
A nonvolatile memory device and a method of forming the nonvolatile memory device, the method including forming a tunnel insulating layer on a substrate, wherein forming the tunnel insulating layer includes forming a multi-element insulating layer by a process including sequentially supplying a first element source, a second element source, and a third element source to the substrate, forming a charge storage layer on the tunnel insulating layer, forming a blocking insulating layer on the charge storage layer, and forming a control gate electrode on the blocking insulating layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.