Reduced-pain allergy skin test device

USRE46823E1 · kind E1 · reissue

Inventors

• Ziv Harish · Tenafly, US
• Isaac Rubinstein · Haworth, US
• Ehud Arbit · Englewood, US
• Russ Weinzimmer · Milford, US

Key dates

• Filing date: Dec 3, 2015
• Grant date: May 8, 2018
• Expiry date: Dec 3, 2035

Classification

• Technology area (CPC —): General

Abstract

An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin.