Patent assignee · IL · COMPANY

6OVER6 VISION LTD.

16Patents
15Active
16Granted
47Portfolio score

Filing activity: Jun 5, 2014 → Jun 28, 2021

Most-cited patents

PatentTitleAreaCited byStatus
US9549669B2 System and method for measurement of refractive error of an eye based on subjective distance metering Human Necessities 21 Active
US10712233B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 4 Active
US10702149B2 Apparatus, system and method of determining a pupillary distance Physics 4 Active
US10670494B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 3 Active
US10684191B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 3 Active
US10876921B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 2 Active
US10898071B2 System and method for measurement of refractive error of an eye based on subjective distance metering Human Necessities 1 Active
US10876923B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 1 Active
US10702143B2 System and method for measurement of refractive error of an eye based on subjective distance metering Human Necessities 1 Active
US11852559B2 Apparatus, system, and method of determining one or more parameters of a lens Physics 0 Active
US12295659B2 Subjective refraction exam system Human Necessities 0 Active
US11931105B2 Apparatus, system and method of determining a pupillary distance Physics 0 Active
US11426065B2 Apparatus, system and method of determining one or more parameters of a refractive error of a tested eye Physics 0 Active
US11054336B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 0 Active
US12169153B2 Apparatus, system and method of determining one or more optical parameters of a lens Physics 0 Active
US10578515B2 Apparatus, system and method of determining one or more optical parameters of a lens General 0 Revoked

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.