Apparatus, system, and method of determining one or more parameters of a lens
US11852559B2 · kind B2 · utility
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2References
26Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 9, 2020 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Sep 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02C13/003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more parameters of a lens, For example, a computing device may be configured to process at least one depth map including depth information captured via a lens; and to determine one or more parameters of the lens based on the depth information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.