Anchor Semiconductor, Inc.
7Patents
6Active
7Granted
43Portfolio score
Filing activity: Aug 27, 2004 → Apr 5, 2021 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7275227B1 | Method of checking optical proximity correction data | Physics | 25 | Expired |
| US7765515B2 | Pattern match based optical proximity correction and verification of integrated circuit layout | Physics | 8 | Active |
| US9846934B2 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Physics | 5 | Active |
| US10546085B2 | Pattern centric process control | Physics | 4 | Active |
| US10997340B2 | Pattern centric process control | Physics | 4 | Active |
| US10062160B2 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Physics | 0 | Active |
| US11694009B2 | Pattern centric process control | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.