ATEIP GMBH
1Patents
1Active
1Granted
38Portfolio score
Filing activity: Jun 14, 2019 → Jun 14, 2019
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11320477B2 | Method and device for electrical testing of an electrical assembly for defects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.