Method and device for electrical testing of an electrical assembly for defects
US11320477B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 14, 2019 |
| Grant date | May 3, 2022 |
| Priority date | — |
| Expiry date | Jun 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2812
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for electrical testing of an electrical circuit for defects, all electrical or electronic parts are measured simultaneously, so an electrical image of the electrical circuit is received by a control/evaluation unit, in which an electrical excitation signal of an electrical current or an electrical voltage is applied simultaneously by the control/evaluation unit and a plurality of driver circuits at a plurality of test points of the electrical circuit, which test points may be arranged in any way. The electrical excitation signals applied via the driver circuits differ with regard to their spectral characteristic. The electrical current flowing in the particular test point and the resultant electrical voltage are recorded synchronously with regard to a waveform in relation to an electrical ground potential, and subsequently parameters of the parts and their electrical connections are calculated by the control/evaluation unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.