Chapman Instruments, Inc.
6Patents
0Active
6Granted
27Portfolio score
Filing activity: Aug 4, 1989 → Mar 24, 2006
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5017012A | Viewing system for surface profiler | Physics | 30 | Expired |
| US6342705B1 | System for locating and measuring an index mark on an edge of a wafer | Electricity | 30 | Expired |
| US6157450A | Automated optical surface profile measurement system | Physics | 28 | Expired |
| US5986753A | Wafer holding and orienting fixture for optical profilometry | Physics | 18 | Expired |
| US7283256B2 | Method and apparatus for measuring wafer thickness | Physics | 2 | Expired |
| US7280232B2 | Method and apparatus for measuring wafer thickness | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.