Insystems, Inc.
6Patents
0Active
6Granted
29Portfolio score
Filing activity: May 20, 1985 → Nov 14, 1990
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4806774A | Inspection system for array of microcircuit dies having redundant circuit patterns | Physics | 91 | Expired |
| US5172000A | Spatial filter for optically based defect inspection system | Physics | 31 | Expired |
| USRE33956E | Inspection system for array of microcircuit dies having redundant circuit patterns | General | 28 | Expired |
| US4811409A | Method and apparatus for detecting defect information in a holographic image pattern | Physics | 24 | Expired |
| US4659172A | Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus | Physics | 13 | Expired |
| US4712851A | Positioning alignment apparatus and method using holographic optical elements | Emerging Cross-Sectional Technologies | 10 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.