Patent assignee · JP · COMPANY

Mitutoyo Mfg. Co., Ltd.

146Patents
0Active
146Granted
39Portfolio score

Filing activity: Sep 24, 1975 → Apr 20, 1988

Most-cited patents

PatentTitleAreaCited byStatus
US4743770A Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light Physics 197 Expired
US4653011A Method of measuring by coordinate measuring instrument and coordinate measuring instrument Physics 155 Expired
US4402481A Articulated device for service component Emerging Cross-Sectional Technologies 84 Expired
US4521112A Optical measuring device with position indicator Physics 71 Expired
US4631834A Coordinate measuring instrument Emerging Cross-Sectional Technologies 57 Expired
US4612656A Digital indication type measuring apparatus Physics 45 Expired
US4229883A Measuring instrument with digital display Physics 44 Expired
US4516327A Touch signal probe Physics 43 Expired
US4578868A Digital display measuring apparatus Physics 38 Expired
US4377911A Contour measuring instrument Physics 32 Expired
US4912322A Optical type displacement detecting device Physics 30 Expired
US4679326A Height gauge Physics 28 Expired
US4279080A Touch signalling probe Physics 28 Expired
US4376543A Dust excluding device Physics 27 Expired
US4736313A Digital indication type length measuring system Physics 26 Expired
US4551919A Measuring instrument Physics 25 Expired
US4725720A Microscope with auto focus and light adjusting means Physics 23 Expired
US4677755A Coordinate measuring instrument Physics 22 Expired
US4648718A Optical measuring system Physics 22 Expired
US4652765A Edge detecting device in optical measuring instrument Physics 20 Expired
US4652738A Edge detecting device in optical measuring instrument Physics 19 Expired
US4748861A Electronic display measuring device Physics 17 Expired
US4727653A Coordinate measuring instrument Physics 17 Expired
US4665739A Surface roughness measuring instrument Physics 16 Expired
US4879552A Variable capacitance type encoder Physics 16 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.