Contour measuring instrument
US4377911A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 1981 |
| Grant date | Mar 29, 1983 |
| Priority date | — |
| Expiry date | Feb 18, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring instrument for measuring the contour of the outer surface of a workpiece. This measuring instrument is of such an arrangement that the tip end of a stylus solidly secured at one end of an arm adapted for rotational movement is brought into contact with the outer surface of the workpiece by a slight pressing force, the arm in this condition is moved in the axial direction thereof, and the displacement of the stylus tracing the irregularities of the outer surface of the workpiece to vertically move due to the abovedescribed movement is converted into the rotational movement of the arm, which is measured by measuring means such as a differential transformer, whereby the contour of the outer surface of the workpiece is measured from the vertical movement of the stylus and the axial (or horizontal) movement of the arm. The arm of the measuring instrument of this type has a dual construction adapted to be held in place by means of springs, wherein a mechanism for detecting the relative movement between these dual arms is provided, whereby a force exceeding a predetermined value applied to the stylus is detected, so that the breakage of the stylus, damages of the object to be …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.