Patent assignee · US · COMPANY

MorphoTrak, LLC

27Patents
27Active
27Granted
47Portfolio score

Filing activity: Nov 16, 2015 → Nov 8, 2019

Most-cited patents

PatentTitleAreaCited byStatus
US9747494B2 Facial matching system Physics 9 Active
US10198821B2 Automated tattoo recognition techniques Physics 8 Active
US9626549B1 Derived virtual quality parameters for fingerprint matching Physics 5 Active
US10062172B2 Automated tattoo recognition techniques Physics 4 Active
US10095938B2 Multi-stage tattoo matching techniques Physics 3 Active
US9846800B2 Fingerprint matching using virtual minutiae Physics 2 Active
US10679092B2 Fast curve matching for tattoo recognition and identification Physics 2 Active
US9754151B2 Derived virtual quality parameters for fingerprint matching Physics 2 Active
US10192137B2 Automatic ruler detection Physics 1 Active
US9690973B2 Feature-based matcher for distorted fingerprint matching Physics 1 Active
US10679094B2 Automatic ruler detection Physics 1 Active
US9946918B2 Symbol detection for desired image reconstruction Physics 1 Active
US10043061B2 Facial matching system Physics 1 Active
US10748018B2 Multi-stage tattoo matching techniques Physics 0 Active
US10755074B2 Latent fingerprint pattern estimation Physics 0 Active
US10255477B2 Feature-based matcher for distorted fingerprint matching Physics 0 Active
US10474872B2 Fingerprint matching using virtual minutiae Physics 0 Active
US10198613B2 Latent fingerprint pattern estimation Physics 0 Active
US10319096B2 Automated tattoo recognition techniques Physics 0 Active
US10423817B2 Latent fingerprint ridge flow map improvement Physics 0 Active
US10395090B2 Symbol detection for desired image reconstruction Physics 0 Active
US10546179B2 Distorted fingerprint matching using pose and minutia grouping Physics 0 Active
US9846801B2 Minutiae grouping for distorted fingerprint matching Physics 0 Active
US11113505B2 Palm print image matching techniques Physics 0 Active
US10740386B2 Multi-stage image matching techniques Physics 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.