Patent assignee · US · COMPANY

PPT Vision

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19Patents
0Active
19Granted
36Portfolio score

Filing activity: Oct 12, 1995 → Jul 30, 2004

Most-cited patents

PatentTitleAreaCited byStatus
US6095661A Method and apparatus for an L.E.D. flashlight Emerging Cross-Sectional Technologies 529 Expired
US6501554B1 3D scanner and method for measuring heights and angles of manufactured parts Physics 242 Expired
US6305818A Method and apparatus for L.E.D. illumination Emerging Cross-Sectional Technologies 171 Expired
US6290382A Fiber bundle combiner and led illumination system and method Electricity 141 Expired
US6808287B2 Method and apparatus for a pulsed L.E.D. illumination source Emerging Cross-Sectional Technologies 136 Expired
US5745176A Machine-vision illumination system and method for delineating a lighted volume from an unlighted volume Physics 94 Expired
US6488390B1 Color-adjusted camera light and method Emerging Cross-Sectional Technologies 83 Expired
US6022124A Machine-vision ring-reflector illumination system and method Physics 82 Expired
US6522777B1 Combined 3D- and 2D-scanning machine-vision system and method Physics 81 Expired
US6554452B1 Machine-vision ring-reflector illumination system and method Physics 65 Expired
US6603103B1 Circuit for machine-vision system Physics 47 Expired
US6084631A High-speed digital video serial link Electricity 39 Expired
US6238060A Machine-vision ring-reflector illumination system and method Physics 35 Expired
US6061089A High-speed digital video serial link Electricity 30 Expired
US6509559B1 Binary optical grating and method for generating a moire pattern for 3D imaging Physics 30 Expired
US6788411B1 Method and apparatus for adjusting illumination angle Physics 19 Expired
US6486963B1 Precision 3D scanner base and method for measuring manufactured parts Physics 13 Expired
US6813016B2 Co-planarity and top-down examination method and optical module for electronic leaded components Physics 8 Expired
US7142301B2 Method and apparatus for adjusting illumination angle Physics 8 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.