Patent assignee · US · COMPANY

RF Saw Components, Inc.

12Patents
0Active
12Granted
33Portfolio score

Filing activity: Dec 18, 2001 → Jul 15, 2005

Most-cited patents

PatentTitleAreaCited byStatus
US6708881B2 Reader for a high information capacity SAW identification tag and method of use thereof Physics 47 Expired
US6759789B2 Surface acoustic wave identification tag having an interdigital transducer adapted for code discrimination and methods of operation and manufacture thereof Emerging Cross-Sectional Technologies 28 Expired
US6756880B2 Reader and response control system for discrimination between multiple surface acoustic wave identification tags and method of operation thereof Physics 27 Expired
US6966493B2 Surface acoustic wave identification tag having enhanced data content and methods of operation and manufacture thereof Physics 18 Expired
US7084768B2 Anti-collision interrogation pulse focusing system for use with multiple surface acoustic wave identification tags and method of operation thereof Physics 12 Expired
US7030762B2 Anti-collision interrogation pulse focusing system for use with multiple surface acoustic wave identification tags and method of operation thereof Physics 9 Expired
US6958696B2 Transfer function system for determining an identifier on a surface acoustic wave identification tag and method of operating the same Electricity 9 Expired
US7096279B2 Object-naming network infrastructure for identification tags and method of operation thereof Physics 7 Expired
US7173360B2 Single phase undirectional surface acoustic wave transducer and improved reflectors Electricity 6 Expired
US7103948B1 Method of manufacturing piezoelectric wafers of saw identification tags Emerging Cross-Sectional Technologies 5 Expired
US7407111B2 Surface acoustic wave identification tag having enhanced data content and methods of operation and manufacture thereof Physics 4 Expired
US6919802B2 Multi-layer method of accommodating code collisions from multiple surface acoustic wave identification tags Physics 2 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.