SD Acquisition Inc.
2Patents
0Active
2Granted
28Portfolio score
Filing activity: May 25, 1999 → Mar 2, 2001
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6381008B1 | Method and system for identifying etch end points in semiconductor circuit fabrication | Physics | 61 | Expired |
| US6580507B2 | Single source, single detector chip, multiple-longitudinal channel electromagnetic radiation absorbance and fluorescence monitoring system | Physics | 51 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.