Patent assignee · US · COMPANY

Seek Thermal, Inc.

48Patents
48Active
48Granted
55Portfolio score

Filing activity: Apr 3, 2014 → Sep 25, 2023 · 1 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US9924116B2 Time based offset correction for imaging systems and adaptive calibration control Electricity 13 Active
US9930324B2 Time based offset correction for imaging systems Electricity 11 Active
USD813288S1 Camera General 7 Active
USD757837S1 Camera General 6 Active
US10458750B2 Thermal weapon sight Electricity 6 Active
USD801403S1 Camera General 5 Active
US9797942B2 Radiometric test and configuration of an infrared focal plane array at wafer probe Physics 5 Active
USD916163S1 Camera enclosure General 5 Active
USD846781S1 Combination flashlight and camera General 4 Active
US10186020B2 Local contrast adjustment for digital images Electricity 4 Active
USD804562S1 Camera General 3 Active
US9727954B2 Local contrast adjustment for digital images Electricity 3 Active
US10230912B2 Fixed pattern noise mitigation for a thermal imaging system Electricity 2 Active
US9947086B2 Image adjustment based on locally flat scenes Physics 2 Active
US9798220B2 Shutter for an infrared camera Electricity 2 Active
USD804558S1 Camera General 2 Active
US10075658B2 Data digitization and display for an imaging system Electricity 2 Active
US10848725B2 Color display modes for a thermal imaging system Physics 2 Active
USD804559S1 Camera General 2 Active
US10890490B2 Thermography process for converting signal to temperature in a thermal imaging system Physics 2 Active
US10362242B2 Selective color display of a thermal image Physics 1 Active
US11276152B2 Adaptive gain adjustment for histogram equalization in an imaging system Physics 1 Active
US9595934B2 Gain calibration for an imaging system Physics 1 Active
US9794455B2 Mechanically isolated external connector Electricity 1 Active
US11625828B2 Cost effective, mass producible system for rapid detection of fever conditions based on thermal imaging Physics 1 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.