Semitest, Inc.
8Patents
0Active
8Granted
29Portfolio score
Filing activity: Jan 20, 1988 → Nov 4, 1999
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4891584A | Apparatus for making surface photovoltage measurements of a semiconductor | Physics | 139 | Expired |
| US5091691A | Apparatus for making surface photovoltage measurements of a semiconductor | Physics | 82 | Expired |
| US4827212A | Noninvasive method and apparatus for characterization of semiconductors | Physics | 50 | Expired |
| US6097205A | Method and apparatus for characterizing a specimen of semiconductor material | Electricity | 34 | Expired |
| US5087876A | Apparatus and method for making surface photovoltage measurements of a semiconductor | Physics | 30 | Expired |
| US5453703A | Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor material | Physics | 30 | Expired |
| US6163163A | Semiconductor material characterizing method and apparatus | Electricity | 11 | Expired |
| US6034535A | Method utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor material | Physics | 9 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.