SiScan Systems, Inc.
6Patents
0Active
6Granted
28Portfolio score
Filing activity: Jul 3, 1985 → Jun 24, 1991
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4748335A | Method and aparatus for determining surface profiles | Physics | 45 | Expired |
| US5184021A | Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask | Physics | 36 | Expired |
| US4707610A | Method and apparatus for measuring surface profiles | Physics | 34 | Expired |
| US4634880A | Confocal optical imaging system with improved signal-to-noise ratio | Physics | 24 | Expired |
| US4847823A | Method and apparatus for reading or measuring magneto-optical storage media using pinhole aperture | Physics | 10 | Expired |
| USRE32660E | Confocal optical imaging system with improved signal-to-noise ratio | General | 10 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.