SYNC-TECH SYSTEM CORP.
1Patents
1Active
1Granted
37Portfolio score
Filing activity: Apr 13, 2016 → Apr 13, 2016
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9952277B2 | Test device and method using single probe to test multiple pads of chip | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.