Patent · US Active

Test device and method using single probe to test multiple pads of chip

US9952277B2 · kind B2 · utility

0Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 13, 2016
Grant dateApr 24, 2018
Priority date—
Expiry dateJul 9, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2844
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test device uses a single probe to test plurality of pads of at least one chip, and includes a test circuit, a plurality of short-circuit elements and a plurality of probes. The plurality of short-circuit elements is formed in scribe lines around the at least one chip, where each of the plurality of short-circuit elements connects the plurality of pads, and the plurality of pads includes one testing pad and at least one non-testing pad. The plurality of probes receives a plurality of test signals generated by the at least one chip from the testing pad via the plurality of short-circuit elements, so the test circuit generates a test result according to the plurality of test signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.