Tevet Process Control Technologies Ltd.
4Patents
0Active
4Granted
31Portfolio score
Filing activity: Feb 7, 2001 → Oct 28, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6678055B2 | Method and apparatus for measuring stress in semiconductor wafers | Physics | 65 | Expired |
| US6885467B2 | Method and apparatus for thickness decomposition of complicated layer structures | Physics | 53 | Expired |
| US6801321B1 | Method and apparatus for measuring lateral variations in thickness or refractive index of a transparent film on a substrate | Physics | 43 | Expired |
| US6762838B2 | Method and apparatus for production line screening | Emerging Cross-Sectional Technologies | 38 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.