TOSHIHIRO ITOH
1Patents
0Active
1Granted
20Portfolio score
Filing activity: Aug 20, 2001 → Aug 20, 2001
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6777967B2 | Inspection method and inspection apparatus | Physics | 7 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.