Ultrapointe Corporation
15Patents
1Active
15Granted
33Portfolio score
Filing activity: Jun 17, 1993 → May 5, 1999
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5479252A | Laser imaging system for inspection and analysis of sub-micron particles | Physics | 220 | Expired |
| US5963314A | Laser imaging system for inspection and analysis of sub-micron particles | Physics | 165 | Expired |
| US5672861A | Method and apparatus for automatic focusing of a confocal laser microscope | Physics | 121 | Expired |
| US6288782A | Method for characterizing defects on semiconductor wafers | Physics | 76 | Expired |
| US5808735A | Method for characterizing defects on semiconductor wafers | Physics | 73 | Expired |
| US5594235A | Automated surface acquisition for a confocal microscope | Physics | 67 | Expired |
| US5783814A | Method and apparatus for automatically focusing a microscope | Physics | 50 | Expired |
| US5923430A | Method for characterizing defects on semiconductor wafers | Physics | 40 | Expired |
| US5761336A | Aperture optimization method providing improved defect detection and characterization | Physics | 35 | Expired |
| US6167148A | Method and system for inspecting the surface of a wafer | Physics | 15 | Expired |
| US6148114A | Ring dilation and erosion techniques for digital image processing | Physics | 11 | Expired |
| USH1530H | Surface extraction from a three-dimensional data set | General | 10 | Active |
| US5798830A | Method of establishing thresholds for image comparison | Physics | 8 | Expired |
| US5504630A | Beam steering apparatus | Physics | 6 | Expired |
| US5557113A | Method and structure for generating a surface image of a three dimensional target | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.