Wyko, Inc.
63Patents
0Active
63Granted
39Portfolio score
Filing activity: Sep 27, 1985 → Jul 31, 2001
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5133601A | Rough surface profiler and method | Physics | 126 | Expired |
| US5471303A | Combination of white-light scanning and phase-shifting interferometry for surface profile measurements | Physics | 117 | Expired |
| US6185315A | Method of combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map | Physics | 99 | Expired |
| US5555471A | Method for measuring thin-film thickness and step height on the surface of thin-film/substrate test samples by phase-shifting interferometry | Physics | 93 | Expired |
| US4639139A | Optical profiler using improved phase shifting interferometry | Physics | 87 | Expired |
| US5355221A | Rough surface profiler and method | Physics | 83 | Expired |
| US5129724A | Apparatus and method for simultaneous measurement of film thickness and surface height variation for film-substrate sample | Physics | 83 | Expired |
| US5602643A | Method and apparatus for correcting surface profiles determined by phase-shifting interferometry according to optical parameters of test surface | Physics | 78 | Expired |
| US4832489A | Two-wavelength phase-shifting interferometer and method | Physics | 69 | Expired |
| US5116115A | Method and apparatus for measuring corneal topography | Human Necessities | 62 | Expired |
| US5122648A | Apparatus and method for automatically focusing an interference microscope | Physics | 51 | Expired |
| US5172002A | Optical position sensor for scanning probe microscopes | Emerging Cross-Sectional Technologies | 40 | Expired |
| US5640270A | Orthogonal-scanning microscope objective for vertical-scanning and phase-shifting interferometry | Physics | 39 | Expired |
| US5204734A | Rough surface profiler and method | Physics | 39 | Expired |
| US4984893A | Phase shifting device and method | Physics | 37 | Expired |
| US5483064A | Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy | Emerging Cross-Sectional Technologies | 36 | Expired |
| US5635016A | Transfer ring or drum apparatus with adjustable circumference | Performing Operations; Transporting | 36 | Expired |
| US5173746A | Method for rapid, accurate measurement of step heights between dissimilar materials | Physics | 34 | Expired |
| US5196713A | Optical position sensor with corner-cube and servo-feedback for scanning microscopes | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5446547A | Combination of motorized and piezoelectric translation for long-range vertical scanning interferometry | Physics | 33 | Expired |
| US5618374A | Belt and tread drum for vehicle tire making machine | Performing Operations; Transporting | 32 | Expired |
| US5173605A | Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control | Emerging Cross-Sectional Technologies | 31 | Expired |
| US5987189A | Method of combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map | Physics | 29 | Expired |
| US5064286A | Optical alignment system utilizing alignment spot produced by image inverter | Physics | 26 | Expired |
| US5354405A | Bead lock drum for use in the manufacture of vehicle tires | Performing Operations; Transporting | 25 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.