Aki Fujimura
2Patents
2h-index
6Co-inventors
27Inventor score
Filing activity: Jul 14, 2003 → Mar 22, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7089516B2 | Measurement of integrated circuit interconnect process parameters | Electricity | 13 | Expired |
| US7024638B2 | Method for creating patterns for producing integrated circuits | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.