Alexander Dikopoltsev
4Patents
4h-index
5Co-inventors
36Inventor score
Filing activity: Apr 12, 2001 → Aug 6, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6895075B2 | X-ray reflectometry with small-angle scattering measurement | Physics | 99 | Expired |
| US6512814B2 | X-ray reflectometer | Physics | 62 | Expired |
| US6639968B2 | X-ray reflectometer | Physics | 51 | Expired |
| US6895071B2 | XRR detector readout processing | Physics | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.