Alexander Savtchouk
5Patents
5h-index
6Co-inventors
45Inventor score
Filing activity: Apr 21, 1999 → May 8, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6114865A | Device for electrically contacting a floating semiconductor wafer having an insulating film | Physics | 114 | Expired |
| US6597193B2 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Physics | 103 | Expired |
| US6680621B2 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Physics | 96 | Expired |
| US6569691B1 | Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer | Electricity | 55 | Expired |
| US6538462B1 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge | Electricity | 50 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.