Amado Ramirez
2Patents
2h-index
4Co-inventors
30Inventor score
Filing activity: May 2, 2005 → Jan 18, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7616021B2 | Method and device for determining an operational lifetime of an integrated circuit device | Physics | 10 | Active |
| US7206703B1 | System and method for testing packaged devices using time domain reflectometry | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.