Patent · US Active

Method and device for determining an operational lifetime of an integrated circuit device

US7616021B2 · kind B2 · utility

10Cited by

4References

3Claims

0Family size

Assignee

Advanced Micro Devices, Inc. · US

Inventors

Vassilios Papageorgiou · Austin, US
Amado Ramirez · Austin, US
Michael Süß · Leipzig, DE

Key dates

Filing date	Jan 18, 2007
Grant date	Nov 10, 2009
Priority date	—
Expiry date	Jan 18, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/287
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An integrated circuit device includes a degradable test structure, a first external interface pin and a second external interface pin, a first conductive path coupling a first node of the degradable test structure and the first external interface pin, and a second conductive path coupling a second node of the degradable test structure and the second external interface pin. Another integrated circuit device includes a non-volatile memory device, a counter comprising an input configured to receive a first clock signal and an output to provide a count value, and control logic configured to store the count value of the counter in the non-volatile memory, whereby the non-volatile memory is externally accessible.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.