Andre Lehovich
2Patents
1h-index
5Co-inventors
30Inventor score
Filing activity: Aug 21, 2013 → Aug 22, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9423362B2 | Primary and secondary scanning in muon tomography inspection | Physics | 3 | Active |
| US10228486B2 | Inspection of objects based on primary and secondary scanning | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.