Andreas Mecke
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Oct 21, 2014 → Oct 21, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10209204B2 | X-ray inspection system and method for rotating a test object by means of such an X-ray inspection system | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.