Andy Struckhoff
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Jan 31, 2000 → Jan 31, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6570177B1 | System, apparatus, and method for detecting defects in particles | Physics | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.