System, apparatus, and method for detecting defects in particles
US6570177B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2000 |
| Grant date | May 27, 2003 |
| Priority date | — |
| Expiry date | Jan 31, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1486
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for automatically inspecting transparent or translucent materials, especially plastic materials, the apparatus including a light container, at least one camera, a digital processor, and a reject mechanism, the method comprising conveying a particle of the material through the light container, capturing an image of the particle with the camera, identifying defects in the image with the digital processor, and separating out defective material by communication between the digital processor and the reject mechanism. The light container is an illumination device, preferably an integrating sphere, that has two opposing openings through which a particle can pass and one or more other openings or windows through which one or more cameras view the particle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.