Andy Volk
1Patents
0h-index
3Co-inventors
19Inventor score
Filing activity: Mar 29, 2006 → Mar 29, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7705620B2 | Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform level | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.