Anil Sama
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Oct 30, 1992 → Oct 30, 1992
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5416782A | Method and apparatus for improving data failure rate testing for memory arrays | Physics | 107 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.