Ankit Jain
9Patents
1h-index
20Co-inventors
43Inventor score
Filing activity: Mar 24, 2015 → Apr 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10267748B2 | Optimizing training sets used for setting up inspection-related algorithms | Electricity | 9 | Active |
| US10964013B2 | System, method for training and applying defect classifiers in wafers having deeply stacked layers | Physics | 1 | Active |
| US11312904B2 | Semiconductor nanocrystal particle and production methods thereof | Performing Operations; Transporting | 1 | Active |
| US10670536B2 | Mode selection for inspection | Emerging Cross-Sectional Technologies | 0 | Active |
| US10338004B2 | Production sample shaping that preserves re-normalizability | Physics | 0 | Active |
| US12382823B2 | Semiconductor nanocrystal particle and production methods thereof | Performing Operations; Transporting | 0 | Active |
| US12165815B2 | Doped metal halide perovskites with improved stability and solar cells comprising same | Emerging Cross-Sectional Technologies | 0 | Active |
| US11237119B2 | Diagnostic methods for the classifiers and the defects captured by optical tools | Emerging Cross-Sectional Technologies | 0 | Active |
| US11639469B2 | Semiconductor nanocrystal particles and production methods thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.