Ankur Anchlia
2Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Jun 23, 2008 → Jun 20, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8286112B2 | Methods for characterization of electronic circuits under process variability effects | Physics | 33 | Active |
| US9411000B2 | Method and system for measuring capacitance difference between capacitive elements | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.