Methods for characterization of electronic circuits under process variability effects
US8286112B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2008 |
| Grant date | Oct 9, 2012 |
| Priority date | — |
| Expiry date | Mar 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining an estimate of statistical properties of an electronic system comprising individual components subject to manufacturing process variability is disclosed. In one aspect, the method comprises obtaining statistical properties of the performance of individual components of the electronic system, obtaining information about execution of an application on the system, simulating execution of the application based on the obtained information about execution of the application on the system for a simulated electronic system realization constructed by selecting individual components with the obtained statistical properties determining the delay and energy of the electronic system, and determining the statistical properties of the delay and energy of the electronic system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.