Armin Bich
2Patents
1h-index
14Co-inventors
37Inventor score
Filing activity: Nov 6, 2007 → Mar 12, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8593642B2 | Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device | Physics | 1 | Active |
| US8253947B2 | Device and method for measuring lithography masks | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.