Arnold E. Barish
2Patents
1h-index
4Co-inventors
37Inventor score
Filing activity: Oct 11, 1989 → Jul 29, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4967151A | Method and apparatus for detecting faults in differential current switching logic circuits | Physics | 14 | Expired |
| US7235994B2 | Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.