Barry Loevsky
12Patents
4h-index
16Co-inventors
49Inventor score
Filing activity: Jan 21, 2014 → Oct 28, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9182219B1 | Overlay measurement based on moire effect between structured illumination and overlay target | Electricity | 12 | Active |
| US9123649B1 | Fit-to-pitch overlay measurement targets | Electricity | 11 | Active |
| US10190979B2 | Metrology imaging targets having reflection-symmetric pairs of reflection-asymmetric structures | Physics | 8 | Active |
| US10877437B2 | Zero order blocking and diverging for holographic imaging | Physics | 6 | Active |
| US10209183B2 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Physics | 1 | Active |
| US9719920B2 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Physics | 1 | Active |
| US9255787B1 | Measurement of critical dimension and scanner aberration utilizing metrology targets | Electricity | 1 | Active |
| US11663937B2 | Pupil tracking in an image display system | Physics | 0 | Active |
| US10458777B2 | Polarization measurements of metrology targets and corresponding target designs | Electricity | 0 | Active |
| US10352766B1 | Focusing modules and methods | Physics | 0 | Active |
| US9429856B1 | Detectable overlay targets with strong definition of center locations | Electricity | 0 | Active |
| US11060845B2 | Polarization measurements of metrology targets and corresponding target designs | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.