Benjamin Jacobs
9Patents
1h-index
13Co-inventors
37Inventor score
Filing activity: Nov 18, 2020 → Feb 19, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11902665B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 2 | Active |
| US10986279B1 | Automated application of drift correction to sample studied under electron microscope | Electricity | 1 | Active |
| US12284445B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
| US12375815B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
| US12010430B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
| US11514586B1 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
| US11477388B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
| US12341190B2 | Coated single crystalline metal oxide materials and method for producing the same | Emerging Cross-Sectional Technologies | 0 | Active |
| US11399138B2 | Automated application of drift correction to sample studied under electron microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.