Inventor · Perrysburg, OH, US

Benjamin L. Moran

14Patents
3h-index
2Co-inventors
42Inventor score

Filing activity: Mar 5, 2015 → Aug 9, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US10267750B2 System and associated method for online detection of small defects on/in a glass sheet Physics 12 Active
US10289930B2 System and associated for online measurement of the optical characteristics of a glass sheet Physics 10 Active
US9470641B1 System and method for measuring reflected optical distortion in contoured glass sheets Physics 9 Active
US9952039B2 System and method for measuring reflected optical distortion in contoured panels having specular surfaces Physics 2 Active
US10851013B2 Glass sheet acquisition and positioning system and associated method for an inline system for measuring the optical characteristics of a glass sheet Physics 2 Active
US9841276B2 System and method for developing three-dimensional surface information corresponding to a contoured glass sheet Physics 0 Active
US9846129B2 System and method for measuring reflected optical distortion in contoured glass sheets Physics 0 Active
US9851200B2 Non-contact gaging system and method for contoured panels having specular surfaces Physics 0 Active
US9952037B2 System and method for developing three-dimensional surface information corresponding to a contoured sheet Physics 0 Active
US9933251B2 Non-contact gaging system and method for contoured glass sheets Physics 0 Active
US11465928B2 Glass sheet acquisition and positioning system and associated method for an inline system for measuring the optical characteristics of a glass sheet Physics 0 Active
US11867630B1 Fixture and method for optical alignment in a system for measuring a surface in contoured glass sheets Physics 0 Active
US12079980B2 System and method for measuring a surface in contoured glass sheets Physics 0 Active
US12020416B2 System and method for measuring a surface in contoured glass sheets General 0 Revoked

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.