System and method for measuring reflected optical distortion in contoured panels having specular surfaces
US9952039B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 26, 2015 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Jun 27, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for measuring reflected optical distortion in a contoured panel having a specular surface includes a conveyor for conveying the panel in a first direction, at least one display projecting a preselected multi-phase non-repeating contrasting pattern, and at least one camera, each one of the cameras uniquely paired with one of the displays. The system may also include a control programmed to execute logic for controlling each of the cameras to acquire the desired images, and logic for analyzing and combining the data acquired by the cameras to construct a definition of the surface of the panel, and logic for performing one or more optical processing operations on the surface data to analyze the optical characteristics of the panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.