Benjamin P. Lynch
3Patents
2h-index
9Co-inventors
33Inventor score
Filing activity: Aug 29, 2003 → May 2, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7305600B2 | Partial good integrated circuit and method of testing same | Physics | 7 | Expired |
| US7434129B2 | Partial good integrated circuit and method of testing same | Physics | 2 | Active |
| US7478301B2 | Partial good integrated circuit and method of testing same | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.